INSIGHT I Spatio-temporal metrology at focus of ultra-short laser pulses

BEAM SHAPING

INSIGHT

Complete 3D metrology at focus for ultra-short lasers

 

Developed by the CEA and SourceLAB, the INSIGHT system is a breakthrough metrology sensor to be inserted at the attenuated focus of ultra-short laser systems.

It offers full access to the complex E field (amplitude and phase) in space-time/frequency, in the far-field and the near-field.

It is associated to state-of-the-art analysis algorithms to support the experimentalists in finding the good conditions for interaction.

Insight

Key features

  • 3D metrology of complex E-field at focus for ultra-short lasers
  • Complete “real-beam” input to 3D simulation codes
  • Access to comprehensive information on chromatic aberration through Zernike decomposition for each frequency
  • Fine measurements of intentionally introduced space-time couplings for advanced beam control (attosecond lighthouse, light springs, …)


100 TW laser pulse E-field reconstructed in time and space through the best focus plane

Zernike decomposition of the near-field spectrally-resolved spatial phase

Performances

  • Very compact
  • Full software suite for acquisition and analysis
  • At focus, where the interaction takes place
  • High spatial and spectral resolution
  • Suitable for few-cycle laser pulses
  • Suitable for ultra-intense lasers

Performances

  • Very compact
  • Full software suite for acquisition and analysis
  • At focus, where the interaction takes place
  • High spatial and spectral resolution
  • Suitable for few-cycle laser pulses
  • Suitable for ultra-intense lasers

Laser Power: No limit (attenuated)
Laser spectral range: Typ 750-850 nm, more or other on request

Pulse duration: femtosecondes type applications
Dimension: 155 x 225 x 96 mm

  • F.Quéré & F.Sylla
    Complete space-time metrology of ultrashort laser pulses with INSIGHT
    Invited talk video
Overview

Complete 3D metrology at focus for ultra-short lasers

 

Developed by the CEA and SourceLAB, the INSIGHT system is a breakthrough metrology sensor to be inserted at the attenuated focus of ultra-short laser systems.

It offers full access to the complex E field (amplitude and phase) in space-time/frequency, in the far-field and the near-field.

It is associated to state-of-the-art analysis algorithms to support the experimentalists in finding the good conditions for interaction.

Insight

Key features

  • 3D metrology of complex E-field at focus for ultra-short lasers
  • Complete “real-beam” input to 3D simulation codes
  • Access to comprehensive information on chromatic aberration through Zernike decomposition for each frequency
  • Fine measurements of intentionally introduced space-time couplings for advanced beam control (attosecond lighthouse, light springs, …)


100 TW laser pulse E-field reconstructed in time and space through the best focus plane

Zernike decomposition of the near-field spectrally-resolved spatial phase

Performances

  • Very compact
  • Full software suite for acquisition and analysis
  • At focus, where the interaction takes place
  • High spatial and spectral resolution
  • Suitable for few-cycle laser pulses
  • Suitable for ultra-intense lasers

Performances

  • Very compact
  • Full software suite for acquisition and analysis
  • At focus, where the interaction takes place
  • High spatial and spectral resolution
  • Suitable for few-cycle laser pulses
  • Suitable for ultra-intense lasers

Specifications

Laser Power: No limit (attenuated)
Laser spectral range: Typ 750-850 nm, more or other on request

Pulse duration: femtosecondes type applications
Dimension: 155 x 225 x 96 mm

Downloads
Publications
  • F.Quéré & F.Sylla
    Complete space-time metrology of ultrashort laser pulses with INSIGHT
    Invited talk video